SICE Journal of Control, Measurement, and System Integration (JCMSI) announces that it will publish a special issue entitled “the special issue on SICE Annual Conference 2016” in May, 2017.
The objective of this special issue is to gather original and high-quality studies presented in SICE Annual Conference 2016 and to dispatch their revised/extended versions to all over the world. This special issue focuses on any areas covered in the conference, which include, but not limited to:
System Integration,
System and Information,
Industrial Applications,
Life Engineering.
Important Dates

Paper Submission Deadline: October 31, 2016
Paper Acceptance Notification: January 2017
Journal Publication:  May 2017

Important matters to be attended to:
For submission to the special issue based on Position Papers of SICE Annual Conference 2016, the authors are recommended to revise/improve their conference papers to meet the high quality standard of the journal.
Regular papers of SICE Annual Conference 2016 will be included in the IEEE Xplore Digital Library. Hence, all submissions to the special issue based on extensions of materials presented in Regular Papers of the conference must comply with the following conditions:
(1) The paper titles must be different from the ones in the conference proceedings;
(2) The authors must cite their paper that appears in the conference proceedings;
(3) In the journal paper, the authors must describe in detail how the submitted journal paper differs from the cited conference paper. In particular, the additional original contribution in the journal paper has to be pointed out explicitly in the first section.
Meeting these three conditions is not mandatory for submission based on Position Papers of the conference.Upon submission, please indicate a SICE2016 Paper ID at "Enter Comments" on Editorial Manager.
Please also note that, when submitting first and final manuscripts of conference papers on PaperCept, it is unnecessary to express the intention of contributing to the JCMSI special issue.

Guest Editors
Tetsuo Kotoku (AIST Japan), Hiroshi Ito (Kyushu Institute of Technology)